TY  - SER
AU  - Ference, Thomas G.
AU  - Clark, Wiliam F.
AU  - Hook, Terence B.
TI  - The Combined Effects of Deuterium Anneals and Deuterated Barrier-Nitride Processing on Hot-Electron Degradation in Mosfet'S
KW  - Annealing
KW  - Deuterium
KW  - Hot Carrier
ER  -