TY  - SER
AU  - ling, Chi-Hai
AU  - Ang, C H
AU  - Ang, D. S.
TI  - Characterization of Leakage Current in Thin Gate Oxide Subjected to 10 Kev X-Ray Irradiation
KW  - Leakage Currents
KW  - Mos
KW  - Thin Oxide
ER  -