Vogel, Eric M. Henson, W. Kirklen Suehle, John S. <br/><br/>
limitations of Conductance ToMeasurement OfInterface State Density of Mos Capacitoras with  Tunneling Gate Gate Dielectrdics 

 - 601-608 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Capacitance<br/>Conductance<br/>Dielectric Films