Miranda, Enrique Sune, Jordi Campabadal, Francesca <br/><br/>
Soft Breakdon Conduction in Ultrathin (3-5 Nm) Gate Dielectrics 

 - 82-89 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Charge Injection<br/>Dielectric Breakdown<br/>Leakage Currents