lin, Shih-Chieh Kuo, James B. Sun, Shih-Wei A Closed- Form Back-Gate-Bias Related Inverse Narrow-Channel Effect Model for Deep-Submicron Vlsi Cmos Devices Using Shaliow Trench Isolation - 725-733 p. Subjects--Topical Terms: StiCon Formal MappingInverse Narrowchannel Effect