TY  - SER
AU  - Bhavnagarwala, A.  J
AU  - Tang, Xinghai
AU  - Meindl, James D.
TI  - The Impact Ofintrinsic Device Fluctuations on Cmos Sram Celi Jstability
KW  - Mosfet Fluctuations
KW  - Sram Scaling
KW  - Static Noise Margin
ER  -