Bhavnagarwala, A.  J Tang, Xinghai Meindl, James D. <br/><br/>
The Impact Ofintrinsic Device Fluctuations on Cmos Sram Celi Jstability 

 - 659-665 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Mosfet Fluctuations<br/>Sram Scaling<br/>Static Noise Margin