TY  - SER
AU  - Ker, Ming-Dou
AU  - lin, Kun-Hsien
TI  - The Impact of Low-Holding-Voltage Issue in High-Voltage Cmos Technology andDesign of Latchup-Free Power-Rail Esd Clamp Circuit  for  Lcd Driver Ics
KW  - Electrostatic Discharge (Esd)
KW  - Power-Rail Esd Clamp Circuit
KW  - Latchup
ER  -