Ker, Ming-Dou lin, Kun-Hsien <br/><br/>
The Impact of Low-Holding-Voltage Issue in High-Voltage Cmos Technology andDesign of Latchup-Free Power-Rail Esd Clamp Circuit  for  Lcd Driver Ics 

 - 1751-1759 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electrostatic Discharge (Esd)<br/>Power-Rail Esd Clamp Circuit<br/>Latchup