Kang, Hae-Gweon Song, Un-Sig Kim, Jin-Ho <br/><br/>
Method to PreventMalfunction Caused byTrans Former Magnetizing Inrush Current Using Iec 61850-Based Ied and Dynamic  Performance Test Using Rtds Test-Bed 

 - 1104-1111 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Ied<br/>Real Time<br/>Over Current Relay