Hall, Cecil E. <br/><br/>
Introduction to Electron Microscopy  

 - 2nd 
 - New York :   McGraw-Hill,   c1966 
 - IX, 397 p.  : ill 
 - International Series in Pure and Applied Physics .
<br/><br/>Includes Index 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electron Microscopes
<br/><br/><label>Dewey Class. No.: </label>535.3325  / HAL