Hurst, Stanley L. <br/><br/>
VLSI Testing Digital and Mixed Analogue Digital Techniques  

 - London :   Institution of Electrical Engineers,   c1998 
 - XX, 532 p.  : ill 
 - Iee Circuits Devices and Systems Series ; No. 9 .
<br/><br/>Includes Bibliographical References and Index 
<br/><br/><label>ISBN: </label>0852969015 
<br/><br/><label>ISSN: </label>
<br/><br/><label>Subjects--Topical Terms: </label><br/>Digital Analogue Testing<br/>Digital Circuits and Fault Models
<br/><br/><label>Dewey Class. No.: </label>621.395  / HUR