Kabisatpathy, Prithviraj <br/><br/>
Fault Diagnosis of Analog Integrated Circuits  

 - Dordrecht :   Springer,   c2005 
 - IX, 182 p.  : ill 
 - Frontiers in Electronic Testing ; V. 30 .
<br/><br/>Includes Bibliographical References and Index 
<br/><br/><label>ISBN: </label>038725742X 
<br/><br/><label>ISSN: </label>
<br/><br/><label>Subjects--Topical Terms: </label><br/>Linear Integrated Circuits<br/>Linear Integrated Circuits Testing
<br/><br/><label>Dewey Class. No.: </label>621.3815  / KAB