Schroder, Dieter K. <br/><br/>
Semiconductor Material and Device Characterization  

 - 3rd 
 - Hoboken, Nj :   John Wiley,   c2006 
 - XV, 779 p.  : ill 
<br/><br/>Includes Bibliographical References and Index 
<br/><br/><label>ISBN: </label>0471739065 
<br/><br/><label>ISSN: </label>
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors<br/>Semiconductors Testing
<br/><br/><label>Dewey Class. No.: </label>621.38152  / SCH