Wilkening, Gunter <br/><br/>
Nanoscale Calibration Standards and Methods Dimensional and Related Measurements in the Micro and Nanometer Range  

 - Weinheim :   Wiley-Vch,   c2005 
 - XXII, 519 p.  : ill 
<br/><br/>Includes Bibliographical References and Index 
<br/><br/><label>ISBN: </label>352740502X 
<br/><br/><label>ISSN: </label>
<br/><br/><label>Subjects--Topical Terms: </label><br/>Microstructures Measurement Congresses<br/>Nanostructured Materials Measurement Congresses
<br/><br/><label>Dewey Class. No.: </label>620.50287  / WIL