TY  - BOOK
AU  - Diebold, Alain C.
TI  - Handbook of Silicon Semiconductor Metrology 
SN  - 0824705068
U1  - 621.381522102 
PY  - 2001///
CY  - New York : 
PB  - Marcel Dekker, 
KW  - Semiconductors Inspections Handbooks Manuals
KW  - Semiconductors Measurements Handbooks Manuals
N1  - NN
UR  - https://eaklibrary.neduet.edu.pk:8443/catalog/bk/books/toc/0-8247-0506-8.pdf
ER  -