Impact of Strain Relaxation of Almga1-Mn Layer on 2-Deg Sheet Charge Density and Current Voltage Characterisic of Lattice Mismatched Almga1-M N/Gan Hemts

By: Material type: ArticleArticleDescription: 205-212 pSubject(s): In: Microelectronics Journal
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Articles Articles Periodical Section Vol.33, No.03 (Mar. 2002) Available