Briefs---- Simulating Program Disturb Faults in Flash Memories Using Spice Compatible Electrical Model

By: Material type: ArticleArticleDescription: 2286-2305 pSubject(s): In: Ieee Transactions on Electron Devices
Holdings
Item type Current library Call number Vol info Status Date due Barcode
Articles Articles Periodical Section Vol.50, No.11 (Nov. 2003) Available