Analysis OfShort-Term Dc-Current Gain Variation During High Current Density Low Temperature Stress of Algaas/Faas Heterojunction Bipolar Transistors

By: Material type: ArticleArticleDescription: 274-281 pSubject(s): In: IEEE Transactions on Electron Devices
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Articles Articles Periodical Section Vol.47, No.02 (Feb. 2000) Available