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Scanning Electron Microscopy and X Ray Microanalysis

By: Contributor(s): Material type: TextTextLanguage: English Publication details: New York : Springer, c2003Edition: 3rdDescription: XIX, 690 p. : ill +1cdISBN:
  • 9780306472923
Subject(s): DDC classification:
  • 502.825 GOL
Online resources:
Holdings
Item type Current library Collection Shelving location Call number Copy number Status Date due Barcode
Reference Collection Reference Collection Reference Section Department of Materials Engineering Reference Section 502.825 GOL 2009-2010 Available 84737