Normal view
MARC view
Entry Personal Name
001 - CONTROL NUMBER
- control field: 825617
003 - CONTROL NUMBER IDENTIFIER
- control field: NEDUET
005 - DATE AND TIME OF LATEST TRANSACTION
- control field: 20230819181400.0
008 - FIXED-LENGTH DATA ELEMENTS
- fixed length control field: 230819|| aca||aabn | a|a d
040 ## - CATALOGING SOURCE
- Original cataloging agency: NEDUET
- Transcribing agency: NEDUET
100 ## - HEADING--PERSONAL NAME
- Personal name: Cheng, K. T
670 ## - SOURCE DATA FOUND
- Source citation: Work cat.: (NEDUET)775047: Cheng, K. T, Improved Hot-Carrier Reliability of Silicon-on-Insulator Transistors By Deuterium Passivation of Defects At Oxide/Silicon Interfaces