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MARC view
Entry Personal Name
001 - CONTROL NUMBER
- control field: 779950
003 - CONTROL NUMBER IDENTIFIER
- control field: NEDUET
005 - DATE AND TIME OF LATEST TRANSACTION
- control field: 20230819162724.0
008 - FIXED-LENGTH DATA ELEMENTS
- fixed length control field: 230819|| aca||aabn | a|a d
040 ## - CATALOGING SOURCE
- Original cataloging agency: NEDUET
- Transcribing agency: NEDUET
100 ## - HEADING--PERSONAL NAME
- Personal name: Lanzoni, Nassimo
670 ## - SOURCE DATA FOUND
- Source citation: Work cat.: (NEDUET)745005: Ricco, Bruno 768878, Modeling and Simulation of Stress-Induced Leakage Current in Ultrathin Sio2 Films