Normal view
MARC view
Entry Personal Name
001 - CONTROL NUMBER
- control field: 779742
003 - CONTROL NUMBER IDENTIFIER
- control field: NEDUET
005 - DATE AND TIME OF LATEST TRANSACTION
- control field: 20230819162705.0
008 - FIXED-LENGTH DATA ELEMENTS
- fixed length control field: 230819|| aca||aabn | a|a d
040 ## - CATALOGING SOURCE
- Original cataloging agency: NEDUET
- Transcribing agency: NEDUET
100 ## - HEADING--PERSONAL NAME
- Personal name: Chao, Tien-Sheng
670 ## - SOURCE DATA FOUND
- Source citation: Work cat.: (NEDUET)744910: Shiue, Jao-Hsian 776325, A Study of Interface Trap Generation by Fowler-Nordheim and Substrate-Hot-Carrier Stresses Fo 4-Nm Thick Gate Oxides