Normal view
MARC view
Entry Topical Term
001 - CONTROL NUMBER
- control field: 777577
003 - CONTROL NUMBER IDENTIFIER
- control field: NEDUET
005 - DATE AND TIME OF LATEST TRANSACTION
- control field: 20230819162409.0
008 - FIXED-LENGTH DATA ELEMENTS
- fixed length control field: 230819|| aca||aabn | a|a d
040 ## - CATALOGING SOURCE
- Original cataloging agency: NEDUET
- Transcribing agency: NEDUET
150 ## - HEADING--TOPICAL TERM
- Topical term or geographic name entry element: Drain Leakge Degradation
670 ## - SOURCE DATA FOUND
- Source citation: Work cat.: (NEDUET)743999: Wang, Tahui 777572, A Comprehensive Study of Hot Carier Stress-Induced Drain Leakage Current Degradation in Thin-Oxide N-Mosfet'S