Normal view MARC view

Entry Personal Name

Number of records used in: 1

001 - CONTROL NUMBER

  • control field: 777017

003 - CONTROL NUMBER IDENTIFIER

  • control field: NEDUET

005 - DATE AND TIME OF LATEST TRANSACTION

  • control field: 20230819162326.0

008 - FIXED-LENGTH DATA ELEMENTS

  • fixed length control field: 230819|| aca||aabn | a|a d

040 ## - CATALOGING SOURCE

  • Original cataloging agency: NEDUET
  • Transcribing agency: NEDUET

100 ## - HEADING--PERSONAL NAME

  • Personal name: Chen, Kua L

670 ## - SOURCE DATA FOUND

  • Source citation: Work cat.: (NEDUET)743795: Chen, Kua L., A Test Chip Design for Detecting Thin-Film Cracking in Integrated Circuits