Normal view MARC view

Entry Topical Term

Number of records used in: 1

001 - CONTROL NUMBER

  • control field: 768169

003 - CONTROL NUMBER IDENTIFIER

  • control field: NEDUET

005 - DATE AND TIME OF LATEST TRANSACTION

  • control field: 20230819161206.0

008 - FIXED-LENGTH DATA ELEMENTS

  • fixed length control field: 230819|| aca||aabn | a|a d

040 ## - CATALOGING SOURCE

  • Original cataloging agency: NEDUET
  • Transcribing agency: NEDUET

150 ## - HEADING--TOPICAL TERM

  • Topical term or geographic name entry element: Sram Scaling

670 ## - SOURCE DATA FOUND

  • Source citation: Work cat.: (NEDUET)740250: Bhavnagarwala, A. J 768163, The Impact Ofintrinsic Device Fluctuations on Cmos Sram Celi Jstability