Machine Learning for High Risk Applications Approaches to Responsible AI (Record no. 814568)
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000 -LEADER | |
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fixed length control field | 02366nam a22002897a 4500 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 240115s2023 |||||||| |||| 00| 0 eng d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 9781098102432 |
022 ## - INTERNATIONAL STANDARD SERIAL NUMBER | |
ISSN-L | 9781098102432 |
041 ## - LANGUAGE CODE | |
Language code of text/sound track or separate title | English |
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
Classification number | 006.31 |
Item number | HAL |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Hall, Patrick |
9 (RLIN) | 879930 |
Relator term | author |
245 ## - TITLE STATEMENT | |
Title | Machine Learning for High Risk Applications Approaches to Responsible AI |
250 ## - EDITION STATEMENT | |
Edition statement | 1st |
260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
Place of publication, distribution, etc. | Beijing : |
Name of publisher, distributor, etc. | O'Reilly, |
Date of publication, distribution, etc. | c2023 |
300 ## - PHYSICAL DESCRIPTION | |
Extent | xxi, 438 p. |
Other physical details | : ill |
504 ## - BIBLIOGRAPHY, ETC. NOTE | |
Bibliography, etc. note | Includes Bibliographical References and Index |
520 ## - SUMMARY, ETC. | |
Summary, etc. | SUMMARY<br/><br/>The past decade has witnessed the broad adoption of artificial intelligence and machine learning (AI/ML) technologies. However, a lack of oversight in their widespread implementation has resulted in some incidents and harmful outcomes that could have been avoided with proper risk management. Before we can realize AI/ML's true benefit, practitioners must understand how to mitigate its risks.<br/><br/>This book describes approaches to responsible AI—a holistic framework for improving AI/ML technology, business processes, and cultural competencies that builds on best practices in risk management, cybersecurity, data privacy, and applied social science. Authors Patrick Hall, James Curtis, and Parul Pandey created this guide for data scientists who want to improve real-world AI/ML system outcomes for organizations, consumers, and the public.<br/><br/> Learn technical approaches for responsible AI across explainability, model validation and debugging, bias management, data privacy, and ML security<br/> Learn how to create a successful and impactful AI risk management practice<br/> Get a basic guide to existing standards, laws, and assessments for adopting AI technologies, including the new NIST AI Risk Management Framework<br/> Engage with interactive resources on GitHub and Colab |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
9 (RLIN) | 845 |
Topical term or geographic name entry element | Machine Learning |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
9 (RLIN) | 152180 |
Topical term or geographic name entry element | Risk Management |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
9 (RLIN) | 161081 |
Topical term or geographic name entry element | Artificial Intelligence |
700 ## - ADDED ENTRY--PERSONAL NAME | |
Relator term | author |
Personal name | Curtis, James |
9 (RLIN) | 879931 |
700 ## - ADDED ENTRY--PERSONAL NAME | |
Relator term | author |
Personal name | Pandey, Parul |
9 (RLIN) | 879932 |
700 ## - ADDED ENTRY--PERSONAL NAME | |
Relator term | forwarded |
Personal name | Sudjianto, Agus |
9 (RLIN) | 879941 |
856 ## - ELECTRONIC LOCATION AND ACCESS | |
Link text | TOC |
Uniform Resource Identifier | <a href="https://eaklibrary.neduet.edu.pk:8443/catalog/bk/books/toc/9781098102432.pdf">https://eaklibrary.neduet.edu.pk:8443/catalog/bk/books/toc/9781098102432.pdf</a> |
856 ## - ELECTRONIC LOCATION AND ACCESS | |
Link text | WEB LINK |
Uniform Resource Identifier | <a href="https://www.oreilly.com/library/view/machine-learning-for/9781098102425/?_gl=1*10zza40*_ga*NjExNTU4NzgzLjE3MDQ4NjM4MjE.*_ga_092EL089CH*MTcwNTA1NTE5MC4zLjEuMTcwNTA1NTQyNS41NS4wLjA.">https://www.oreilly.com/library/view/machine-learning-for/9781098102425/?_gl=1*10zza40*_ga*NjExNTU4NzgzLjE3MDQ4NjM4MjE.*_ga_092EL089CH*MTcwNTA1NTE5MC4zLjEuMTcwNTA1NTQyNS41NS4wLjA.</a> |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Source of classification or shelving scheme | Dewey Decimal Classification |
Koha item type | Book |
Withdrawn status | Lost status | Source of classification or shelving scheme | Physical Form | Damaged status | Not for loan | Home library | Current library | Shelving location | Date acquired | Source of acquisition | Stock Type | Cost, normal purchase price | Total Checkouts | Full call number | Barcode | Date last seen | Budget Year | Cost, replacement price | Accession Date | Koha item type |
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Dewey Decimal Classification | Text, Paperback | Reference Section | Reference Section | Reference Section | 09/01/2024 | 39 | Purchased | 23221.82 | 006.31 HAL | 98571 | 09/01/2024 | 2023-2024 | 27319.79 | 09/01/2024 | Reference Collection |