Analog Testing with Time Response Parameters. (Record no. 800290)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00398nab a2200133Ia 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 230808s1996 |||||||f |||| 00| 0 eng d |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Balivada, Ashok |
| 9 (RLIN) | 858938 |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Chen, Jin |
| 9 (RLIN) | 244294 |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Abraham, Jacob A |
| 9 (RLIN) | 792520 |
| 245 #0 - TITLE STATEMENT | |
| Title | Analog Testing with Time Response Parameters. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 18-25 p. |
| 773 ## - HOST ITEM ENTRY | |
| Place, publisher, and date of publication | 1996 |
| Title | Ieee Design and Test of Computers |
| International Standard Serial Number | 07407475 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Articles |
| -- | 51 |
| -- | ABUL KALAM Library |
| Not for loan | Home library | Serial Enumeration / chronology | Total Checkouts | Date last seen | Koha item type |
|---|---|---|---|---|---|
| Engr Abul Kalam Library | Vol.13, No.02 (Apr. 1996) | 20/08/2023 | Articles |