Finding Ambiguity Group in Low Testability Analog Circuit. (Record no. 790049)

MARC details
000 -LEADER
fixed length control field 00539nab a2200157Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s2000 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Piccirilli, M. C
9 (RLIN) 847457
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Pang, J
9 (RLIN) 847458
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Starzyk, J. A
9 (RLIN) 832668
245 #0 - TITLE STATEMENT
Title Finding Ambiguity Group in Low Testability Analog Circuit.
300 ## - PHYSICAL DESCRIPTION
Extent 1125-1137 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Ambiguity Groups
9 (RLIN) 805358
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Analog System
9 (RLIN) 812665
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 2000
Title Ieee Transactions on Circuits and Systems, I: Fundamental Theory and Applications
International Standard Serial Number 10577122
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
-- 51
-- ABUL KALAM Library
Holdings
Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.47, No.08 (Aug. 2000)   20/08/2023 Articles