Temperature Dependent Characterization on Bipolar Silicon Power Semiconductors- A New Physical Model Validated By Device - Internal Probing Between 400-100k. (Record no. 785076)

MARC details
000 -LEADER
fixed length control field 00590nab a2200157Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s2000 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Kuhn, H
9 (RLIN) 840048
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Mnatsakanov, T. T
9 (RLIN) 840049
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Schlogl, A. E
9 (RLIN) 840050
245 #0 - TITLE STATEMENT
Title Temperature Dependent Characterization on Bipolar Silicon Power Semiconductors- A New Physical Model Validated By Device - Internal Probing Between 400-100k.
300 ## - PHYSICAL DESCRIPTION
Extent 1267-1274 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Mobility
9 (RLIN) 164527
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Physical Modeling
9 (RLIN) 162082
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 2000
Title Ieee Transactions on PowerElectronics
International Standard Serial Number 08858993
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
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Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.15, No.06 (Nov. 2000)   20/08/2023 Articles