System-on-Chip Testability Using Lssd Scan Structures (Record no. 777839)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00434nab a2200133Ia 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 230808s2001 |||||||f |||| 00| 0 eng d |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Zarrineh, Kamran |
| 9 (RLIN) | 826249 |
| 245 #0 - TITLE STATEMENT | |
| Title | System-on-Chip Testability Using Lssd Scan Structures |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 83-97 p. |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | System on Chip |
| 9 (RLIN) | 767191 |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Testability Using Lssd Scan Structures |
| 9 (RLIN) | 810607 |
| 773 ## - HOST ITEM ENTRY | |
| Place, publisher, and date of publication | 2001 |
| Title | Ieee Design and Test of Computers |
| International Standard Serial Number | 07407475 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Articles |
| -- | 51 |
| -- | ABUL KALAM Library |
| Not for loan | Home library | Serial Enumeration / chronology | Total Checkouts | Date last seen | Koha item type |
|---|---|---|---|---|---|
| Engr Abul Kalam Library | Vol.18, No.03 (May. 2001) | 20/08/2023 | Articles |