Four Different Approaches for Measurement of Ic Surface Temperature: Application to Thermal Testing (Record no. 776892)

MARC details
000 -LEADER
fixed length control field 00504nab a2200145Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s2002 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Altet, Josep
9 (RLIN) 770689
245 #0 - TITLE STATEMENT
Title Four Different Approaches for Measurement of Ic Surface Temperature: Application to Thermal Testing
300 ## - PHYSICAL DESCRIPTION
Extent 689-696 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Thermal Testing
9 (RLIN) 746524
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Scanning Thermal Microscopy
9 (RLIN) 766179
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Laser Reflectometry
9 (RLIN) 828283
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 2002
Title Microelectronics Journal
International Standard Serial Number 00262692
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
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-- ABUL KALAM Library
Holdings
Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.33, No.09 (Sep. 2002)   20/08/2023 Articles