An Alternative Method for Transistor Low Frequency Noise Estimation By Measuring Phase Noise of Test Oscillator (Record no. 773541)

MARC details
000 -LEADER
fixed length control field 00474nab a2200133Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s2002 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Jevtic, Milan N.
9 (RLIN) 770285
245 #3 - TITLE STATEMENT
Title An Alternative Method for Transistor Low Frequency Noise Estimation By Measuring Phase Noise of Test Oscillator
300 ## - PHYSICAL DESCRIPTION
Extent 955-960 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Noise Measurement
9 (RLIN) 808651
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Low Frequency Circuits
9 (RLIN) 810084
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 2002
Title Microelectronics Journal
International Standard Serial Number 00262692
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
-- 51
-- ABUL KALAM Library
Holdings
Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.33, No.11 (Nov. 2002)   19/08/2023 Articles