Fast Interface Characterization of Tunnel Oxide Mos Structures (Record no. 773396)

MARC details
000 -LEADER
fixed length control field 00474nab a2200145Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s2002 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Sell, Bernhard
9 (RLIN) 822803
245 #0 - TITLE STATEMENT
Title Fast Interface Characterization of Tunnel Oxide Mos Structures
300 ## - PHYSICAL DESCRIPTION
Extent 110-113 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Capacitance Measurement
9 (RLIN) 777238
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Flatband Potential
9 (RLIN) 822805
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Oxide Thickness
9 (RLIN) 810475
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 2002
Title Ieee Transactions on Nanotechnology
International Standard Serial Number 1536125X
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
-- 51
-- ABUL KALAM Library
Holdings
Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.01, No.02 (Jun. 2002)   19/08/2023 Articles