Low Frequency and 1/F Noise in Wide-Gap Semiconductors : Silicon Carbide and Gallium Nitride (Record no. 769939)

MARC details
000 -LEADER
fixed length control field 00570nab a2200145Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s2002 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Levinshtein, M.E.
9 (RLIN) 776351
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Rumyantsev, S.L.
9 (RLIN) 776875
245 #0 - TITLE STATEMENT
Title Low Frequency and 1/F Noise in Wide-Gap Semiconductors : Silicon Carbide and Gallium Nitride
300 ## - PHYSICAL DESCRIPTION
Extent 32-39 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Low-Frequency Noise in Silicon Carbide
9 (RLIN) 818171
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Low-Frequency Noise in Gan/Gaain Feild Effect Transistors
9 (RLIN) 818173
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 2002
Title Iee Proceedings:Circuits, Devices and Systems
International Standard Serial Number 13502409
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
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-- ABUL KALAM Library
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Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.149, No.01 (Feb. 2002)   19/08/2023 Articles