Optical Properties of Pecvd Dielectric Thin Films: Thickness and Deposition Method Depdence (Record no. 765412)

MARC details
000 -LEADER
fixed length control field 00430nab a2200133Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s2002 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Zhou, H
9 (RLIN) 811801
245 #0 - TITLE STATEMENT
Title Optical Properties of Pecvd Dielectric Thin Films: Thickness and Deposition Method Depdence
300 ## - PHYSICAL DESCRIPTION
Extent 999-1004 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Plasma
9 (RLIN) 115419
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Thickness Dependent
9 (RLIN) 810168
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 2002
Title Microelectronics Journal
International Standard Serial Number 00262692
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
-- 51
-- ABUL KALAM Library
Holdings
Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.33, No.11 (Nov. 2002)   19/08/2023 Articles