Channel Width Dependence of Nmosfet Hot Carrier Degradation (Record no. 761426)

MARC details
000 -LEADER
fixed length control field 00459nab a2200145Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s2003 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Li, Erhong
9 (RLIN) 808381
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Prasad, Sharad
9 (RLIN) 808383
245 #0 - TITLE STATEMENT
Title Channel Width Dependence of Nmosfet Hot Carrier Degradation
300 ## - PHYSICAL DESCRIPTION
Extent 1545-1548 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Impact Ionization
9 (RLIN) 771576
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Channel Width
9 (RLIN) 808385
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 2003
Title Ieee Transactions on Electron Devices
International Standard Serial Number 00189383
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
-- 51
-- ABUL KALAM Library
Holdings
Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.50, No.06 (Jun. 2003)   19/08/2023 Articles