Channel Width Dependence of Nmosfet Hot Carrier Degradation (Record no. 761426)
[ view plain ]
000 -LEADER | |
---|---|
fixed length control field | 00459nab a2200145Ia 4500 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 230808s2003 |||||||f |||| 00| 0 eng d |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Li, Erhong |
9 (RLIN) | 808381 |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Prasad, Sharad |
9 (RLIN) | 808383 |
245 #0 - TITLE STATEMENT | |
Title | Channel Width Dependence of Nmosfet Hot Carrier Degradation |
300 ## - PHYSICAL DESCRIPTION | |
Extent | 1545-1548 p. |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Impact Ionization |
9 (RLIN) | 771576 |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Channel Width |
9 (RLIN) | 808385 |
773 ## - HOST ITEM ENTRY | |
Place, publisher, and date of publication | 2003 |
Title | Ieee Transactions on Electron Devices |
International Standard Serial Number | 00189383 |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Koha item type | Articles |
-- | 51 |
-- | ABUL KALAM Library |
Not for loan | Home library | Serial Enumeration / chronology | Total Checkouts | Date last seen | Koha item type |
---|---|---|---|---|---|
Engr Abul Kalam Library | Vol.50, No.06 (Jun. 2003) | 19/08/2023 | Articles |