Universal Error Corrections for Finite Semiconductor Resitivity in Cross - Kelvin Resistor Test Structures (Record no. 760889)

MARC details
000 -LEADER
fixed length control field 00489nab a2200133Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s2004 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Holland, Anthony S.
9 (RLIN) 807663
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Reeves, Geoffrey K.
9 (RLIN) 807665
245 #0 - TITLE STATEMENT
Title Universal Error Corrections for Finite Semiconductor Resitivity in Cross - Kelvin Resistor Test Structures
300 ## - PHYSICAL DESCRIPTION
Extent 914-919 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Cross Ambiguity Function
9 (RLIN) 807666
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 2004
Title Ieee Transactions on Electron Devices
International Standard Serial Number 00189383
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
-- 51
-- ABUL KALAM Library
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Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.51, No.06 (Jun. 2004)   19/08/2023 Articles