The Analysis of Dark Signals InCmos Aps Imagers fromCharacterization of Test Structures (Record no. 757680)

MARC details
000 -LEADER
fixed length control field 00531nab a2200157Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s2004 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Kwon, Hyuck In
9 (RLIN) 803360
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Kang, in Man
9 (RLIN) 710212
245 #4 - TITLE STATEMENT
Title The Analysis of Dark Signals InCmos Aps Imagers fromCharacterization of Test Structures
300 ## - PHYSICAL DESCRIPTION
Extent 178-184 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Cmos Active Pixel
9 (RLIN) 769483
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Dark Signals
9 (RLIN) 803361
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Deep-Level Bulk Traps
9 (RLIN) 803362
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 2004
Title Ieee Journal of Solid-State Circuits
International Standard Serial Number 00189200
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
-- 51
-- ABUL KALAM Library
Holdings
Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.39, No.02 (Feb. 2004)   19/08/2023 Articles