Analytical Drain Thermal Noise Current Model Valid for Deep Submicron Mosfets (Record no. 757196)

MARC details
000 -LEADER
fixed length control field 00492nab a2200145Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s2004 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Han, Kwangseok
9 (RLIN) 760779
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Shin, Hyungcheol
9 (RLIN) 802475
245 #0 - TITLE STATEMENT
Title Analytical Drain Thermal Noise Current Model Valid for Deep Submicron Mosfets
300 ## - PHYSICAL DESCRIPTION
Extent 261-269 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Carrier Heating
9 (RLIN) 802476
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Channel Length Modulation
9 (RLIN) 708229
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 2004
Title Ieee Journal of Solid-State Circuits
International Standard Serial Number 00189200
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
-- 51
-- ABUL KALAM Library
Holdings
Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.39, No.02 (Feb. 2004)   19/08/2023 Articles