Hole Traps in Silicon Dioxides-Part I: Properties (Record no. 755203)

MARC details
000 -LEADER
fixed length control field 00483nab a2200157Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s2004 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Zhang, Jian F.
9 (RLIN) 799641
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Zhao, Ce Z.
9 (RLIN) 799642
245 #0 - TITLE STATEMENT
Title Hole Traps in Silicon Dioxides-Part I: Properties
300 ## - PHYSICAL DESCRIPTION
Extent 1267-1273 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Anomalous
9 (RLIN) 719304
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Border Traps
9 (RLIN) 799645
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Breakdown Process
9 (RLIN) 697923
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 2004
Title Ieee Transactions on Electron Devices
International Standard Serial Number 00189383
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
-- 51
-- ABUL KALAM Library
Holdings
Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.51, No.08 (Aug. 2004)   19/08/2023 Articles