A March Test for Functional Faults in Semiconductor Random Access Memories (Record no. 750861)
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000 -LEADER | |
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fixed length control field | 00514nab a2200157Ia 4500 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 230808s1981 |||||||f |||| 00| 0 eng d |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Reddy, S. M. |
9 (RLIN) | 492673 |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Suk, D.S. |
9 (RLIN) | 792537 |
245 #2 - TITLE STATEMENT | |
Title | A March Test for Functional Faults in Semiconductor Random Access Memories |
300 ## - PHYSICAL DESCRIPTION | |
Extent | 982-985 p. |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Functional Faults |
9 (RLIN) | 792538 |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Lower Bounds |
9 (RLIN) | 753464 |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Random Access Memory (Ram) |
9 (RLIN) | 769045 |
773 ## - HOST ITEM ENTRY | |
Place, publisher, and date of publication | 1981 |
Title | IEEE Transactions on Computers |
International Standard Serial Number | 00189340 |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Koha item type | Articles |
-- | 51 |
-- | ABUL KALAM Library |
Not for loan | Home library | Serial Enumeration / chronology | Total Checkouts | Date last seen | Koha item type |
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Engr Abul Kalam Library | Vol.30, No.12 (Dec. 1981) | 19/08/2023 | Articles |