A March Test for Functional Faults in Semiconductor Random Access Memories (Record no. 750861)

MARC details
000 -LEADER
fixed length control field 00514nab a2200157Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s1981 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Reddy, S. M.
9 (RLIN) 492673
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Suk, D.S.
9 (RLIN) 792537
245 #2 - TITLE STATEMENT
Title A March Test for Functional Faults in Semiconductor Random Access Memories
300 ## - PHYSICAL DESCRIPTION
Extent 982-985 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Functional Faults
9 (RLIN) 792538
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Lower Bounds
9 (RLIN) 753464
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Random Access Memory (Ram)
9 (RLIN) 769045
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 1981
Title IEEE Transactions on Computers
International Standard Serial Number 00189340
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
-- 51
-- ABUL KALAM Library
Holdings
Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.30, No.12 (Dec. 1981)   19/08/2023 Articles