Paraliel Testing for Pattern-Sensitive Faults in Semiconductor Random-Access Memories (Record no. 750512)

MARC details
000 -LEADER
fixed length control field 00524nab a2200157Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s1982 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Mazumder, P.
9 (RLIN) 792018
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Patel, Janak K.
9 (RLIN) 792019
245 #0 - TITLE STATEMENT
Title Paraliel Testing for Pattern-Sensitive Faults in Semiconductor Random-Access Memories
300 ## - PHYSICAL DESCRIPTION
Extent 394-407 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Memory Testing
9 (RLIN) 783692
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Dynamic Pattern-Sensitive Fault
9 (RLIN) 792020
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Ram
9 (RLIN) 764969
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 1982
Title IEEE Transactions on Computers
International Standard Serial Number 00189340
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
-- 51
-- ABUL KALAM Library
Holdings
Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.31, No.12 (Dec. 1982)   19/08/2023 Articles