Optimal Design and Sequential Analysis of Vlsi Testing Strategy (Record no. 746972)

MARC details
000 -LEADER
fixed length control field 00540nab a2200169Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s1988 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Yu, Philip S.
9 (RLIN) 325098
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Krishna, C.M.
9 (RLIN) 260249
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Lee, Y. H.
9 (RLIN) 762191
245 #0 - TITLE STATEMENT
Title Optimal Design and Sequential Analysis of Vlsi Testing Strategy
300 ## - PHYSICAL DESCRIPTION
Extent 339-347 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Design of Experiments
9 (RLIN) 690028
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Performance Analysis
9 (RLIN) 714495
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Vlsi Testing
9 (RLIN) 776813
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 1988
Title IEEE Transactions on Computers
International Standard Serial Number 00189340
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
-- 51
-- ABUL KALAM Library
Holdings
Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.37, No.03 (Mar. 1988)   19/08/2023 Articles