Reverse Current Instabilities in Amorphous Silicon Schottky Diodes Modeling and Experiments (Record no. 745330)

MARC details
000 -LEADER
fixed length control field 00585nab a2200169Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s1999 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Aflatooni, Koorosh
9 (RLIN) 780697
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Hornsey, Richard
9 (RLIN) 780698
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Nathan, Arokia
9 (RLIN) 780699
245 #0 - TITLE STATEMENT
Title Reverse Current Instabilities in Amorphous Silicon Schottky Diodes Modeling and Experiments
300 ## - PHYSICAL DESCRIPTION
Extent 1417-1422 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Amorphous Silicon
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Carrier Transport Efficiency
9 (RLIN) 780700
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element X-Ray Imaging
9 (RLIN) 704401
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 1999
Title IEEE Transactions on Electron Devices
International Standard Serial Number 00189383
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
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-- ABUL KALAM Library
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Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.46, No.07 (Jul. 1999)   19/08/2023 Articles