Giant Isotope Effect in Hot Electron Degradation of Metal Oxide Silicon Devices (Record no. 745255)

MARC details
000 -LEADER
fixed length control field 00579nab a2200169Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s1998 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Hess, K
9 (RLIN) 780536
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Kizilyalil, Lsik C.
9 (RLIN) 780537
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Lyding, Joseph W.
9 (RLIN) 780538
245 #0 - TITLE STATEMENT
Title Giant Isotope Effect in Hot Electron Degradation of Metal Oxide Silicon Devices
300 ## - PHYSICAL DESCRIPTION
Extent 406-416 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Charge Carrier Processes
9 (RLIN) 771264
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Cmos Integrated Circuit
9 (RLIN) 761245
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Transistor Array
9 (RLIN) 713999
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 1998
Title IEEE Transactions on Electron Devices
International Standard Serial Number 00189383
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
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-- ABUL KALAM Library
Holdings
Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.45, No.02 (Feb. 1998)   19/08/2023 Articles