Rf Measyrement Technique for Characterizing Thin Dielectric Films (Record no. 745157)

MARC details
000 -LEADER
fixed length control field 00553nab a2200169Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s1998 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Ma, Zhengxiang
9 (RLIN) 780297
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Becker, andrew J.
9 (RLIN) 780298
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Polakos, P.
9 (RLIN) 780299
245 #0 - TITLE STATEMENT
Title Rf Measyrement Technique for Characterizing Thin Dielectric Films
300 ## - PHYSICAL DESCRIPTION
Extent 1811-1816 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Capacitance Measurement
9 (RLIN) 777238
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Capacitors
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Dielectric Measurements
9 (RLIN) 780300
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 1998
Title IEEE Transactions on Electron Devices
International Standard Serial Number 00189383
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
-- 51
-- ABUL KALAM Library
Holdings
Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.45, No.08 (Aug. 1998)   19/08/2023 Articles