Positive Bias Temperaure Instability in Mosfet'S (Record no. 745018)

MARC details
000 -LEADER
fixed length control field 00472nab a2200157Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s1998 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Zhang, J. F.
9 (RLIN) 776728
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Eccleston, W.
9 (RLIN) 776730
245 #0 - TITLE STATEMENT
Title Positive Bias Temperaure Instability in Mosfet'S
300 ## - PHYSICAL DESCRIPTION
Extent 116-124 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Positive Real
9 (RLIN) 779970
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Temperature
9 (RLIN) 119334
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Mosfet
9 (RLIN) 720139
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 1998
Title IEEE Transactions on Electron Devices
International Standard Serial Number 00189383
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
-- 51
-- ABUL KALAM Library
Holdings
Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.45, No.01 (Jan. 1998)   19/08/2023 Articles