Improvement OfReliability of Amorphous Silicon Transistors by Conduction-Band Tail Width Reduction (Record no. 744863)

MARC details
000 -LEADER
fixed length control field 00555nab a2200157Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s1998 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Gadelrab, Serag M.
9 (RLIN) 778325
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Chamberlain, Savvas G.
9 (RLIN) 778326
245 #0 - TITLE STATEMENT
Title Improvement OfReliability of Amorphous Silicon Transistors by Conduction-Band Tail Width Reduction
300 ## - PHYSICAL DESCRIPTION
Extent 2179-2186 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Amorphous Silicon
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Amorphous Sitability
9 (RLIN) 779647
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Energy Band Tails
9 (RLIN) 779648
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 1998
Title IEEE Transactions on Electron Devices
International Standard Serial Number 00189383
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
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  Engr Abul Kalam Library Vol.45, No.10 (Oct. 1998)   19/08/2023 Articles