A Unified Understanding on Fuliy-Depleted Soi Nmosfet Hot-Carrier Degradation (Record no. 744841)

MARC details
000 -LEADER
fixed length control field 00573nab a2200169Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s1998 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Banna, Srinivasa R.
9 (RLIN) 776162
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Chan, Philip C. H.
9 (RLIN) 768417
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Fung, Samuel K. H.
9 (RLIN) 777392
245 #2 - TITLE STATEMENT
Title A Unified Understanding on Fuliy-Depleted Soi Nmosfet Hot-Carrier Degradation
300 ## - PHYSICAL DESCRIPTION
Extent 206-212 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Degradation
9 (RLIN) 170999
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Fuliy-Depleted Soi Mosfet
9 (RLIN) 771955
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Hot Carrier
9 (RLIN) 767189
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 1998
Title IEEE Transactions on Electron Devices
International Standard Serial Number 00189383
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
-- 51
-- ABUL KALAM Library
Holdings
Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.45, No.01 (Jan. 1998)   19/08/2023 Articles